STP Published: 2007
STP1466-EB

Techniques in Thermal Analysis: Hyphenated Techniques, Thermal Analysis of the Surface, and Fast Rate Analysis

Editor(s): Wei-Ping Pan, Lawrence Judovits

Nine peer-reviewed papers reflect the latest research in thermal analysis, including fast scan calorimetry in both instrument development and techniques.

Sections cover:

Hyphenated Techniques—seven papers cover the use of thermogravimetric analysis (TGA) with another technique. Topics deal with temperature-modulated differential scanning calorimetry; improved modeling when using hyphenated techniques; a simple calibration method for the quantitative use of mass spectrometry with TGA for a variety of encountered off gases; and much more.

Fast Rate Analysis—covers fast scan calorimetry in both instrument development and techniques. Fast heating rates were employed to study epoxy curing and fast rate analysis allowed the separation of the glass transition and cure exotherm.

Thermal Analysis of the Surface—discusses the use of a modified atomic force microscope (AFM), or Micro-Thermal Analysis, that uses the AFM probe as a thermal device.

Table of Contents

Richard E. Lyon, Richard N. Walters, Stanislav I. Stoliarov

Alan T. Riga, Michael Golinar, Kenneth S. Alexander

Alan T. Riga, Kenneth S. Alexander, Kevin Williams

Wendy J. Collins, Corey DuBois, R. Thomas Cambron, Nancy L. Redman-Furey, Adrienne S. Bigalow Kern

Nancy L. Redman-Furey, Michael L. Dicks, Jane Godlweski, Dana C. Vaughn, Wendy J. Collins

Nancy L. Redman-Furey, Michael L. Dicks, Jane Godlweski, Dana C. Vaughn, Wendy J. Collins

Zhongxian Cheng, Hui-ling Chen, Yan Zhang, Pauline Hack, Wei-Ping Pan

Adrienne S. Bigalow Kern, Wendy J. Collins, R. Thomas Cambron, Nancy L. Redman-Furey

Carlton G. Slough

Ramón Artiaga, Ricardo Cao, Salvador Naya, Bárbara González-Martin, José L. Mier, Ana Garcia

Quentin Lineberry, Thandi Buthelezi, Wei-Ping Pan

Bryan Bilyeu, Witold Brostow, Kevin P. Menard

Carlton G. Slough, Azzedine Hammiche, Mike Reading, Hubert M. Pollock

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Details
Developed by Committee: E37
Pages: 80
DOI: 10.1520/STP1466-EB
ISBN-EB: 978-0-8031-6236-5
ISBN-13: 978-0-8031-5616-6